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VLSI Physical Design  ›  Ch 10. Devices & Low-Power

Latch-Up in CMOS

  • It originates from the body-bias connection.
  • Noise current together with the body-bias connection resistance creates a positive feedback loop that ultimately short-circuits power to ground.
  • The parasitic BJT is formed by the CMOS device structure and needs a trigger voltage to fire.
  • That trigger voltage comes from the body-bias resistance and the noise current.
  • The trigger voltage is fixed because the device is fixed by the CMOS structure.
  • The maximum noise current is also fixed for a given technology.
  • Therefore the body-bias resistance must be controlled to avoid latch-up.
  • This limit is what determines the maximum allowed spacing between tap cells.

KEY Latch-up is a parasitic BJT feedback loop; controlling body-bias resistance via tap-cell spacing prevents it.

14nm vs 7nm

Moving from a higher to a lower technology node brings more complex challenges, including:

  • More crosstalk.
  • More DRCs.
  • More IR drop.
  • Smaller area, leading to more congestion issues.
  • Signal electromigration violations.
  • Higher power dissipation.

KEY Going to 7nm worsens crosstalk, DRCs, IR drop, congestion, signal EM and power dissipation.